发明公开
- 专利标题: SEMICONDUCTOR STRUCTURE
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申请号: US18093497申请日: 2023-01-05
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公开(公告)号: US20230154848A1公开(公告)日: 2023-05-18
- 发明人: Haiyang ZHANG , Panpan LIU
- 申请人: Semiconductor Manufacturing International (Shanghai) Corporation , Semiconductor Manufacturing International (Beijing) Corporation
- 申请人地址: CN Shanghai
- 专利权人: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- 当前专利权人: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- 当前专利权人地址: CN Shanghai
- 优先权: CN 1911012609.X 2019.10.23
- 主分类号: H01L23/528
- IPC分类号: H01L23/528 ; H01L23/532
摘要:
A semiconductor structure is provided in the present disclosure. The semiconductor structure includes a substrate, a plurality of fins on the substrate, a plurality of isolation structures on the substrate, each formed on a top surface of the substrate between adjacent fins, and a power rail formed in at least one isolation structure of the plurality of isolation structures and further in the substrate, where a top surface of the power rail is lower than a top surface of the plurality of fins.
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