Invention Publication
- Patent Title: PLASMA ETCHING METHOD USING PERFLUOROISOPROPYL VINYL ETHER
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Application No.: US17917155Application Date: 2021-02-18
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Publication No.: US20230162972A1Publication Date: 2023-05-25
- Inventor: Chang-Koo KIM , Jun-Hyun KIM
- Applicant: AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Current Assignee: AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Priority: KR 20200041505 2020.04.06
- International Application: PCT/KR2021/002053 2021.02.18
- Date entered country: 2022-10-05
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/311

Abstract:
A plasma etching method is disclosed. The plasma etching method comprises: a first step of vaporizing liquid perfluoroisopropyl vinylether (PIPVE); a second step of supplying, to a plasma chamber in which an object to be etched is arranged, the vaporized PIPVE and a discharge gas comprising argon gas; and a third step of discharging the discharge gas so as to generate plasma, and using same so as to plasma-etch the object to be etched.
Public/Granted literature
- US12191141B2 Plasma etching method using perfluoroisopropyl vinyl ether Public/Granted day:2025-01-07
Information query
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