发明公开
- 专利标题: WAFER PROCESSING METHOD
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申请号: US17562045申请日: 2021-12-27
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公开(公告)号: US20230162979A1公开(公告)日: 2023-05-25
- 发明人: Nuo-Wei Luo
- 申请人: UNITED MICROELECTRONICS CORPORATION
- 申请人地址: TW HSINCHU
- 专利权人: UNITED MICROELECTRONICS CORPORATION
- 当前专利权人: UNITED MICROELECTRONICS CORPORATION
- 当前专利权人地址: TW HSINCHU
- 优先权: CN 2111387024.3 2021.11.22
- 主分类号: H01L21/027
- IPC分类号: H01L21/027 ; G03F7/16
摘要:
A wafer processing method includes: providing a wafer, wherein the wafer has a first position and a second position, and the first position faces the second position in a reference direction; coating a photoresist liquid on the wafer; and performing a heating process to heat the wafer coated with the photoresist liquid to form a photoresist layer on the wafer, wherein during the heating process, a temperature of the wafer gradually increases in the reference direction, so that a thickness of the photoresist layer gradually decreases in the reference direction.
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