Invention Publication
- Patent Title: Apparatus and Method for High-Accuracy Optical Particle Measuring using Laser Power Scanning
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Application No.: US17763279Application Date: 2021-08-10
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Publication No.: US20230168176A1Publication Date: 2023-06-01
- Inventor: Ji Hun MUN , Sang Woo KANG
- Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Applicant Address: KR Daejeon
- Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Current Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Current Assignee Address: KR Daejeon
- Priority: KR 20200158562 2020.11.24
- International Application: PCT/KR2021/010552 2021.08.10
- Date entered country: 2022-03-24
- Main IPC: G01N15/14
- IPC: G01N15/14

Abstract:
The present invention relates to particle measuring apparatus and a particle measuring method, whereby particle counts per size range can be measured with a high accuracy using a laser power scanning in which lasers of several powers are sequentially irradiated. First, minimum powered lasers capable of measuring particles having more than relevant size are irradiated to a particle measurement space for a predetermined time in response to plural counts of each mutually different particle size, and the counts of particles per size are measured by detecting a scattered light. Furthermore, the counts of particles belonging to each size range can be accurately calculated through an algorithm using the actually measured value.
Public/Granted literature
- US12085496B2 Apparatus and method for high-accuracy optical particle measuring using laser power scanning Public/Granted day:2024-09-10
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