-
1.
公开(公告)号:US20230168176A1
公开(公告)日:2023-06-01
申请号:US17763279
申请日:2021-08-10
发明人: Ji Hun MUN , Sang Woo KANG
IPC分类号: G01N15/14
CPC分类号: G01N15/1429 , G01N2015/1486 , G01N2015/1493
摘要: The present invention relates to particle measuring apparatus and a particle measuring method, whereby particle counts per size range can be measured with a high accuracy using a laser power scanning in which lasers of several powers are sequentially irradiated. First, minimum powered lasers capable of measuring particles having more than relevant size are irradiated to a particle measurement space for a predetermined time in response to plural counts of each mutually different particle size, and the counts of particles per size are measured by detecting a scattered light. Furthermore, the counts of particles belonging to each size range can be accurately calculated through an algorithm using the actually measured value.
-
公开(公告)号:US20180105930A1
公开(公告)日:2018-04-19
申请号:US15562545
申请日:2016-07-28
发明人: Sang Woo KANG , Ji Hun MUN
IPC分类号: C23C16/30 , C23C16/455 , C01G39/06
CPC分类号: C23C16/305 , C01B17/20 , C01G39/06 , C01P2002/82 , C01P2002/85 , C01P2004/03 , C01P2004/04 , C23C16/0227 , C23C16/45527 , C23C16/45553 , C23C16/45555 , C23C16/52 , C30B25/16 , C30B25/186 , C30B29/46 , C30B29/64
摘要: The present invention relates to a method for preparing a two-dimensional transition metal dichalcogenide and, more particularly, to a method for preparing a highly uniform two-dimensional transition metal dichalcogenide thin film. More specifically, the present invention is directed to a preparation method for a highly uniform two-dimensional transition metal dichalcogenide thin film at low temperature of 500° C. or below.
-