Invention Publication
- Patent Title: SELF-TEST MECHANISMS FOR END-OF-LIFE DETECTION AND RESPONSE FOR CIRCUIT INTERRUPTER DEVICES
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Application No.: US18100609Application Date: 2023-01-24
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Publication No.: US20230170173A1Publication Date: 2023-06-01
- Inventor: Ze CHEN , Gui CHEN
- Applicant: Ze CHEN
- Applicant Address: CN Yueqing City
- Assignee: Ze CHEN
- Current Assignee: Ze CHEN
- Current Assignee Address: CN Yueqing City
- The original application number of the division: US17207883 2021.03.22
- Main IPC: H01H71/02
- IPC: H01H71/02 ; H02H1/00 ; H01H71/04 ; H01H71/62 ; H01H83/04 ; H02H3/32 ; H01H47/00 ; H01H50/02 ; H01H50/44 ; H01H83/14 ; H02H3/16 ; H02H3/33
Abstract:
A circuit for a circuit interrupter is provided. The circuit may in include a first SCR configured to receive a first trigger signal at a gate of the first SCR, a second SCR configured to receive a second trigger signal at a gate of the second SCR, and a third SCR configured to receive a third trigger signal at a gate of the third SCR. A cathode of the first SCR may be connected to an anode of the third SCR. A cathode of the second SCR and a cathode of the third SCR may be connected to a ground. Methods of operating a circuit interrupter and a circuit are also provided.
Information query
