Invention Publication
- Patent Title: CIRCUITS AND METHODS FOR VOLTAGE MEASUREMENT
-
Application No.: US17643052Application Date: 2021-12-07
-
Publication No.: US20230176097A1Publication Date: 2023-06-08
- Inventor: Ricardo Pureza Coimbra , Edevaldo Pereira da Silva, JR. , Felipe Ricardo Clayton
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: G01R19/257
- IPC: G01R19/257 ; H03M1/12

Abstract:
An integrated circuit includes an analog-to-digital converter (ADC) configured to receive input voltage, and first and second reference voltages, and outputs digital code representing ratios between the input voltage and the first and the second reference voltages. The first and second reference voltages are generated by a reference generator using different current densities. During a first stage, the ADC samples the first input voltage and the first reference voltage and transfers equivalent charge of the sampled first input voltage and first reference voltage to an integration capacitor. During a second stage, the ADC samples the second reference voltage and transfers equivalent charge of the sampled second reference voltage to the integration capacitor. The ADC provides one bit of digital code based on total charge stored on the integration capacitor after the transfers of charge of the sampled input voltage, and the sampled first and second reference voltages.
Public/Granted literature
- US11733277B2 Circuits and methods for voltage measurement Public/Granted day:2023-08-22
Information query