Invention Application
- Patent Title: LASER IRRADIATION STATE DIAGNOSIS METHOD, LASER IRRADIATION STATE DIAGNOSIS PROGRAM, LASER IRRADIATION STATE DIAGNOSIS DEVICE, AND LASER IRRADIATION DEVICE
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Application No.: US17780278Application Date: 2020-11-26
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Publication No.: US20230019043A1Publication Date: 2023-01-19
- Inventor: Kenjiro MOMI , Kazuhisa FUJITA , Manabu HARAGUCHI , Daisuke MORI , Momo TOSUE
- Applicant: TOYOKOH CO.,LTD.
- Applicant Address: JP Fuji-shi, Shizuoka
- Assignee: TOYOKOH CO.,LTD.
- Current Assignee: TOYOKOH CO.,LTD.
- Current Assignee Address: JP Fuji-shi, Shizuoka
- Priority: JP2019-216905 20191129
- International Application: PCT/JP2020/043918 WO 20201126
- Main IPC: G01N21/17
- IPC: G01N21/17 ; H04R1/08 ; H04R1/40 ; H04R3/00

Abstract:
Disclosed is a laser irradiation state diagnosing method which allows accurately diagnosing a laser irradiation state. When irradiating a laser beam so that an irradiation spot scans the surface of the irradiation object, acoustic information in vicinity of the irradiation spot is acquired. And based on characteristics of the acoustic information, such as an intensity of a component of a specific frequency band or a frequency band distribution, a state of peeling of the adhered substances existing on the surface of the irradiation object is determined.
Information query