Invention Publication
- Patent Title: IMAGE-BASED SEMICONDUCTOR DEVICE PATTERNING METHOD USING DEEP NEURAL NETWORK
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Application No.: US18072998Application Date: 2022-12-01
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Publication No.: US20230197460A1Publication Date: 2023-06-22
- Inventor: Jaewon YANG , Seongjin PARK , Sangchul YEO , Seonmin RHEE , Hyeok LEE , Sooryong LEE , Seungju HAN
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR 20210182211 2021.12.17 KR 20220104329 2022.08.19
- Main IPC: H01L21/308
- IPC: H01L21/308 ; G06T3/40 ; G06V10/46 ; G06V10/82 ; G03F7/20

Abstract:
A semiconductor device patterning method includes generating an input image by imaging information about a pattern of a sample, acquiring an output image of the pattern of the sample after a preset semiconductor process with respect to the sample, generating a predictive model through learning using a Deep Neural Network (DNN) with the input image and the output image, and predicting a pattern image after the semiconductor process for a pattern of a semiconductor device by using the predictive model.
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