- 专利标题: READ THRESHOLD CALIBRATION FOR CROSS-TEMPERATURE LONG, SEQUENTIAL READS
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申请号: US17714379申请日: 2022-04-06
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公开(公告)号: US20230326528A1公开(公告)日: 2023-10-12
- 发明人: Eran Sharon , Nika Yanuka , Idan Alrod , Alexander Bazarsky , Evgeny Mekhanik
- 申请人: Western Digital Technologies, Inc.
- 申请人地址: US CA San Jose
- 专利权人: Western Digital Technologies, Inc.
- 当前专利权人: Western Digital Technologies, Inc.
- 当前专利权人地址: US CA San Jose
- 主分类号: G11C16/10
- IPC分类号: G11C16/10 ; G11C16/26 ; G11C16/08 ; G11C16/24 ; G11C7/04
摘要:
A system and method for calibrating read threshold voltages includes performing a plurality of read operations, determining to perform a read level tracking method, and performing the read level tracking method. The determining may be based on a temperature change or a bit error rate (BER). The read level tracking method includes determining the BER of an indicative word line, determining an adjusted read threshold level based on the BER, and adjusting read threshold levels according to the adjusted read threshold level.
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