• 专利标题: METHOD FOR PRODUCING A SUBSTRATE FOR EPITAXIAL GROWTH OF A GALLIUM-BASED III-N ALLOY LAYER
  • 申请号: US18248169
    申请日: 2021-10-04
  • 公开(公告)号: US20230411140A1
    公开(公告)日: 2023-12-21
  • 发明人: Eric Guiot
  • 申请人: Soitec
  • 申请人地址: FR Bernin
  • 专利权人: Soitec
  • 当前专利权人: Soitec
  • 当前专利权人地址: FR Bernin
  • 优先权: FR 2010206 2020.10.06
  • 国际申请: PCT/FR2021/051709 2021.10.04
  • 进入国家日期: 2023-04-06
  • 主分类号: H01L21/02
  • IPC分类号: H01L21/02 H01L29/66 C30B31/22 C30B29/36 C30B29/40 C30B25/18
METHOD FOR PRODUCING A SUBSTRATE FOR EPITAXIAL GROWTH OF A GALLIUM-BASED III-N ALLOY LAYER
摘要:
A method of producing a substrate for epitaxial growth of a gallium-based III-N alloy layer comprises the following consecutive steps: —providing a donor substrate of semi-insulating monocrystalline silicon carbide, —implanting ionic species in the donor substrate so as to form a zone of weakness defining a thin layer of semi-insulating monocrystalline SiC to be transferred, —bonding the donor substrate to a first receiving substrate by means of a bonding layer, —detaching the donor substrate along the zone of weakness so as to transfer the thin layer of semi-insulating monocrystalline SiC on to the first receiving substrate, —forming an additional layer of semi-insulating SiC on the transferred thin layer, —bonding the additional layer to a second receiving substrate having a high electrical resistivity, —removing at least a portion of the bonding layer so as to detach the first receiving substrate and expose the layer of transferred semi-insulating monocrystalline SiC.
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