- 专利标题： METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL IMAGING AND SPECTROSCOPY
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申请号： US17796822申请日： 2021-02-01
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公开(公告)号： US20230063843A1公开(公告)日： 2023-03-02
- 发明人: Craig Prater , Derek Decker , David Grigg
- 申请人： Photothermal Spectroscopy Corp.
- 申请人地址： US CA Santa Barbara
- 专利权人： Photothermal Spectroscopy Corp.
- 当前专利权人： Photothermal Spectroscopy Corp.
- 当前专利权人地址： US CA Santa Barbara
- 国际申请： PCT/US2021/016070 WO 20210201
- 主分类号： G01J3/10
- IPC分类号： G01J3/10 ; G01J3/447 ; G01J3/02 ; G01J3/453 ; G01J3/28
摘要：
A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
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