-
1.发明申请公开(公告)号：US20230063843A1
公开(公告)日：2023-03-02
申请号：US17796822
申请日：2021-02-01
发明人： Craig Prater , Derek Decker , David Grigg
摘要： A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
-
公开(公告)号：US12066328B2
公开(公告)日：2024-08-20
申请号：US17955122
申请日：2022-09-28
发明人： Derek Decker , Craig Prater
CPC分类号： G01J3/0297 , G01J3/0216 , G01J3/0229 , G01J3/108 , G01J2003/102
摘要： Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
-
公开(公告)号：US20210215601A1
公开(公告)日：2021-07-15
申请号：US17250124
申请日：2019-05-31
发明人： Craig Prater , Derek Decker , Roshan Shetty
IPC分类号： G01N21/3563 , H04N5/235 , G06T7/00 , G02B21/36 , G02B21/06
摘要： Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
-
公开(公告)号：US11486761B2
公开(公告)日：2022-11-01
申请号：US16427866
申请日：2019-05-31
发明人： Derek Decker , Craig Prater
摘要： Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
-
公开(公告)号：US11480518B2
公开(公告)日：2022-10-25
申请号：US16702094
申请日：2019-12-03
发明人： Craig Prater , David Grigg , Derek Decker
摘要： Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
-
公开(公告)号：US20210164894A1
公开(公告)日：2021-06-03
申请号：US16702094
申请日：2019-12-03
发明人： Craig Prater , David Grigg , Derek Decker
摘要： Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
-
7.发明公开公开(公告)号：US20240353324A1
公开(公告)日：2024-10-24
申请号：US18300858
申请日：2023-04-14
发明人： Craig Prater , Derek Decker , David Grigg
IPC分类号： G01N21/3563
CPC分类号： G01N21/3563
摘要： Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
-
公开(公告)号：US20240060885A1
公开(公告)日：2024-02-22
申请号：US18385233
申请日：2023-10-30
发明人： Craig Prater , Derek Decker , Roshan Shetty
IPC分类号： G01N21/3563 , G06T7/00 , G02B21/06 , G02B21/36 , C12M1/00 , C12M1/26 , C12M1/34 , C12M1/36 , C12N1/12 , H04N23/74 , H04N23/741
CPC分类号： G01N21/3563 , G06T7/97 , G02B21/06 , G02B21/365 , C12M21/02 , C12M29/00 , C12M29/04 , C12M29/22 , C12M33/00 , C12M39/00 , C12M41/12 , C12M41/26 , C12M41/34 , C12M41/36 , C12M41/44 , C12M41/48 , C12N1/12 , H04N23/74 , H04N23/741 , G01N2201/061 , G01N2201/062 , G06T2207/10048 , G06T2207/10056 , G06T2207/10152
摘要： Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
-
公开(公告)号：US11879837B2
公开(公告)日：2024-01-23
申请号：US17250124
申请日：2019-05-31
发明人： Craig Prater , Derek Decker , Roshan Shetty
IPC分类号： G01N21/3563 , G06T7/00 , G02B21/06 , G02B21/36 , C12M1/00 , C12M1/26 , C12M1/34 , C12M1/36 , C12N1/12 , H04N23/74 , H04N23/741
CPC分类号： G01N21/3563 , C12M21/02 , C12M29/00 , C12M29/04 , C12M29/22 , C12M33/00 , C12M39/00 , C12M41/12 , C12M41/26 , C12M41/34 , C12M41/36 , C12M41/44 , C12M41/48 , C12N1/12 , G02B21/06 , G02B21/365 , G06T7/97 , H04N23/74 , H04N23/741 , G01N2201/061 , G01N2201/062 , G06T2207/10048 , G06T2207/10056 , G06T2207/10152
摘要： Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
-
公开(公告)号：US20240044782A1
公开(公告)日：2024-02-08
申请号：US18452023
申请日：2023-08-18
发明人： Craig Prater , David Grigg , Derek Decker
CPC分类号： G01N21/35 , G02B21/002 , G01J3/45
摘要： Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
-
-
-
-
-
-
-
-
-
搜索结果
14 条记录 (耗时 0.016 秒)
