A semiconductor package includes: a first semiconductor chip including first pads; a second semiconductor chip below the first semiconductor chip, the second semiconductor chip including a substrate including a front surface and an opposing rear surface, second pads on the front surface and in contact with the first pads, and through-electrodes electrically connected to the second pads and including protruding portions protruding from the rear surface of the substrate; through-via structures disposed around the second semiconductor chip and in contact with the first pads; a first dielectric layer extending along the rear surface of the substrate and side surfaces of the protruding portions of the through-electrodes; a second dielectric layer below the first dielectric layer and in a space between the protruding portions of the through-electrodes and between the through-via structures; and bump structures below the second dielectric layer and electrically connected to the through-electrodes and the through-via structures.