- 专利标题: SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND CONTROL METHOD OF SOLID-STATE IMAGING ELEMENT
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申请号: US18142949申请日: 2023-05-03
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公开(公告)号: US20240007770A1公开(公告)日: 2024-01-04
- 发明人: Atsumi Niwa , Yusuke Oike
- 申请人: Sony Semiconductor Solutions Corporation
- 申请人地址: JP Kanagawa
- 专利权人: Sony Semiconductor Solutions Corporation
- 当前专利权人: Sony Semiconductor Solutions Corporation
- 当前专利权人地址: JP Kanagawa
- 优先权: JP 18008850 2018.01.23
- 主分类号: H04N25/772
- IPC分类号: H04N25/772 ; H04N25/53 ; H04N25/443 ; H04N25/445 ; H04N25/707 ; H04N25/47
摘要:
An object is to reduce a circuit scale in a solid-state imaging element that detects an address event.
The solid-state imaging element is provided with a plurality of photoelectric conversion elements, a signal supply unit, and a detection unit. In this solid-state imaging element, each of the plurality of photoelectric conversion elements photoelectrically converts incident light to generate a first electric signal. Furthermore, in the solid-state imaging element, the detection unit detects whether or not a change amount of the first electric signal of each of the plurality of photoelectric conversion elements exceeds a predetermined threshold and outputs a detection signal indicating a result of the detection result.
The solid-state imaging element is provided with a plurality of photoelectric conversion elements, a signal supply unit, and a detection unit. In this solid-state imaging element, each of the plurality of photoelectric conversion elements photoelectrically converts incident light to generate a first electric signal. Furthermore, in the solid-state imaging element, the detection unit detects whether or not a change amount of the first electric signal of each of the plurality of photoelectric conversion elements exceeds a predetermined threshold and outputs a detection signal indicating a result of the detection result.
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