Invention Publication
- Patent Title: FAST PROGRAM RECOVERY WITH REDUCED PROGRAMING DISTURBANCE IN A MEMORY DEVICE
-
Application No.: US18224538Application Date: 2023-07-20
-
Publication No.: US20240028253A1Publication Date: 2024-01-25
- Inventor: Avinash Rajagiri , Ching-Huang Lu , Aman Gupta , Shuji Tanaka , Masashi Yoshida , Shinji Sato , Yingda Dong
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A memory device can include a memory array coupled with a control logic. The control logic initiates a program operation on the memory array, the program operation including a program phase and a program recovery phase. The control logic causes a program voltage to be applied to a selected word line during the program phase. The control logic causes a select gate drain coupled with a string of memory cells to deactivate during the program recovery phase after applying the program voltage, where the string of memory cells include a plurality of memory cells each coupled to a corresponding word line of a plurality of wordlines. The control logic causes a voltage to be applied to a select gate source coupled with the string of memory cells to activate the select gate source during the program recovery phase concurrent to causing the select gate drain to deactivate.
Information query