Invention Publication
- Patent Title: SPRAY SYSTEM FOR SLURRY REDUCTION DURING CHEMICAL MECHANICAL POLISHING (CMP)
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Application No.: US18381223Application Date: 2023-10-18
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Publication No.: US20240042571A1Publication Date: 2024-02-08
- Inventor: Chih Chung CHOU , Anand Nilakantan IYER , Ekaterina A. MIKHAYLICHENKO , Christopher Heung-Gyun LEE , Erik RONDUM , Tiffany Yu-nung CHEUNG , Shou-Sung CHANG
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- The original application number of the division: US17359255 2021.06.25
- Main IPC: B24B37/04
- IPC: B24B37/04 ; H01L21/306

Abstract:
Methods and apparatuses for dispensing polishing fluids onto a polishing pad within a chemical mechanical polishing (CMP) system are disclosed herein. In particular, embodiments herein relate to a CMP apparatus for processing a substrate including a pad disposed on a platen. The pad has a pad radius and a central axis from which the pad radius extends. The apparatus also include a carrier assembly configured to be disposed on a surface of the pad and having a carrier radius that extends from a rotational axis of the carrier assembly and a fluid delivery assembly comprising one or more nozzles, each nozzle coupled to a fast actuating valve.
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