发明公开
- 专利标题: METHOD FOR FABRICATING SEMICONDUCTOR DEVICE WITH REDISTRIBUTION STRUCTURE
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申请号: US18378892申请日: 2023-10-11
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公开(公告)号: US20240047447A1公开(公告)日: 2024-02-08
- 发明人: TSE-YAO HUANG
- 申请人: NANYA TECHNOLOGY CORPORATION
- 申请人地址: TW NEW TAIPEI CITY
- 专利权人: NANYA TECHNOLOGY CORPORATION
- 当前专利权人: NANYA TECHNOLOGY CORPORATION
- 当前专利权人地址: TW NEW TAIPEI CITY
- 主分类号: H01L25/18
- IPC分类号: H01L25/18 ; H01L23/00 ; H01L23/532 ; H01L21/768 ; H01L25/00
摘要:
The present application discloses a semiconductor device and a method for fabricating the semiconductor device. The semiconductor device includes a first chip including: a first inter-dielectric layer positioned on a first substrate; a plug structure positioned in the first inter-dielectric layer and electrically coupled to a functional unit of the first chip; a first redistribution layer positioned on the first inter-dielectric layer and distant from the plug structure; a first lower bonding pad positioned on the first redistribution layer; and a second lower bonding pad positioned on the plug structure; and a second chip positioned on the first chip and including: a first upper bonding pad positioned on the first lower bonding pad; a second upper bonding pad positioned on the second lower bonding pad; and a plurality of storage units electrically coupled to the first upper bonding pad and the second upper bonding pad.
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