Invention Publication
- Patent Title: EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT
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Application No.: US18260036Application Date: 2021-12-30
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Publication No.: US20240068964A1Publication Date: 2024-02-29
- Inventor: Shahar Gov , Daniel Kandel , Heath POIS , Parker Lund , Michal Haim YACHINI , Vladimir Machavariani
- Applicant: NOVA LTD.
- Applicant Address: IL Rehovot
- Assignee: NOVA LTD.
- Current Assignee: NOVA LTD.
- Current Assignee Address: IL Rehovot
- International Application: PCT/IB2021/062502 2021.12.30
- Date entered country: 2023-06-30
- Main IPC: G01N23/20
- IPC: G01N23/20

Abstract:
A method, a system, and a non-transitory computer readable medium for evaluating x-ray signals. The method may include calculating an estimated field for each of multiple non-perturbed objects, the multiple non-perturbed objects represent perturbances of the perturbed object; the perturbances are of an order of a wavelength of the non-diffused x-ray signals; and evaluating the non-diffused x-ray signals based on the field of the multiple non-perturbed objects.
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