Invention Publication
- Patent Title: MONITORING SYSTEM, MONITORING DEVICE, MONITORING METHOD
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Application No.: US18231342Application Date: 2023-08-08
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Publication No.: US20240069202A1Publication Date: 2024-02-29
- Inventor: Hidemi Noguchi , Junichi Abe
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP 22134459 2022.08.25
- Main IPC: G01S17/89
- IPC: G01S17/89 ; G01S7/48 ; G01S17/933

Abstract:
A first point cloud acquisition unit controls a first fixed-point three-dimensional LiDAR scanner in such a way that the first fixed-point three-dimensional LiDAR scanner performs scanning in a low-density scanning range including a monitoring target in a scanning range and generates a low-density point cloud. An alignment unit aligns the low-density point cloud and known three-dimensional shape data about the monitoring target with each other. A scanning range determination unit determines a high-density scanning range including the monitoring target in a scanning range and also being narrower than the low-density scanning range, based on a result of the alignment by the alignment unit. A second point cloud acquisition unit controls the first fixed-point three-dimensional LiDAR scanner in such a way that the first fixed-point three-dimensional LiDAR scanner performs scanning in the high-density scanning range and generates a high-density point cloud.
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