Invention Publication
- Patent Title: Method of Adjusting Charged Particle Optical System and Charged Particle Beam Apparatus
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Application No.: US18385115Application Date: 2023-10-30
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Publication No.: US20240145211A1Publication Date: 2024-05-02
- Inventor: Shigeyuki Morishita , Yuji Kohno
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Priority: JP 22174717 2022.10.31
- Main IPC: H01J37/153
- IPC: H01J37/153 ; H01J37/21 ; H01J37/28

Abstract:
A method of adjusting a charged particle optical system in a charged particle beam apparatus provided with the charged particle optical system including an aberration corrector in which multipole elements disposed in three or more stages and transfer optical systems are alternately disposed. The method includes adjusting aberration using at least two of the multipole elements without using at least one of the multipole elements, and adjusting parameters of the charged particle optical system other than aberration using at least one of the transfer optical systems that is not disposed between the at least two of the multipole elements used.
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