Invention Publication
- Patent Title: METHOD OF ADJUSTING PLATING MODULE
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Application No.: US17781363Application Date: 2021-03-05
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Publication No.: US20240183059A1Publication Date: 2024-06-06
- Inventor: Yasuyuki MASUDA , Ryosuke HIWATASHI , Masashi SHIMOYAMA
- Applicant: EBARA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: EBARA CORPORATION
- Current Assignee: EBARA CORPORATION
- Current Assignee Address: JP Tokyo
- International Application: PCT/JP2021/008670 2021.03.05
- Date entered country: 2022-05-31
- Main IPC: C25D21/12
- IPC: C25D21/12 ; C25D17/00 ; C25D17/08 ; C25D21/10

Abstract:
There is provided a method of adjusting a plating module, wherein the plating module comprises a substrate holder configured to hold a substrate, an anode placed to be opposed to the substrate holder, and a plate placed between the substrate holder and the anode to serve as an ionically resistive element. The method comprises: providing a plating module of initial setting, which is initially set in such a state that a porosity in an outer circumferential portion of the plate is adjusted to reduce a plating film thickness in an outer circumferential portion of the substrate to be smaller than a film thickness in another portion; and adjusting a distance between the substrate holder and the plate so as to flatten a distribution of plating film thickness of the entire substrate by adjustment of the distance between the substrate holder and the plate such as to increase a film thickness in the outer circumferential portion of the substrate according to a film thickness distribution of the substrate that is plated in the plating module.
Public/Granted literature
- US12163244B2 Method of adjusting plating module Public/Granted day:2024-12-10
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