Invention Publication
- Patent Title: PROGRAM VERIFY COMPENSATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK
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Application No.: US18521957Application Date: 2023-11-28
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Publication No.: US20240185931A1Publication Date: 2024-06-06
- Inventor: Yu-Chung Lien , Jun Wan , Zhenming Zhou
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/10
Abstract:
A request to perform a program operation to program a set of memory cells on a memory device is received. A defect indicator associated with the set of memory cells is determined to satisfy a defect condition. A value of a program verify parameter is determined based on the defect indicator. The program operation is performed using the value of the program verify parameter during a program verify phase of the program operation.
Information query
