Invention Publication
- Patent Title: NONDESTRUCTIVE INSPECTION SYSTEM
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Application No.: US18553264Application Date: 2022-03-31
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Publication No.: US20240192153A1Publication Date: 2024-06-13
- Inventor: Shigenori NAGANO , Satoshi YANOBE , Akira YAJIMA , Hanako AIKOH , Satoru ISHIGURO , Yoshie OTAKE , Yasuo WAKABAYASHI , Masato TAKAMURA
- Applicant: TOPCON CORPORATION , RIKEN
- Applicant Address: JP Itabashi-ku, Tokyo
- Assignee: TOPCON CORPORATION,RIKEN
- Current Assignee: TOPCON CORPORATION,RIKEN
- Current Assignee Address: JP Itabashi-ku, Tokyo; JP Wako-shi, Saitama
- Priority: JP 21062001 2021.03.31
- International Application: PCT/JP2022/016726 2022.03.31
- Date entered country: 2023-09-29
- Main IPC: G01N23/222
- IPC: G01N23/222 ; G01N23/204 ; G01N23/2206
Abstract:
A nondestructive inspection system 1 is provided with: a neutron radiation unit 10 capable of radiating a first neutron dose of neutrons; a neutron detection unit 20 capable of detecting a second neutron dose of neutrons scattered inside an inspection object A upon radiation of neutrons from the neutron radiation unit 10; a gamma ray detection unit 30 capable of detecting a gamma ray dose released from the inspection object A upon radiation of neutrons from the neutron radiation unit 10; and an analysis unit 50 that calculates the contained amount of a predetermined substance on the basis of the gamma ray dose and corrects the contained amount of the predetermined substance on the basis of the first neutron dose and the second neutron dose.
Information query
