Invention Publication
- Patent Title: IMPLEMENTATION OF DEEP NEURAL NETWORKS FOR TESTING AND QUALITY CONTROL IN THE PRODUCTION OF MEMORY DEVICES
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Application No.: US18586736Application Date: 2024-02-26
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Publication No.: US20240202425A1Publication Date: 2024-06-20
- Inventor: Cheng-Chung Chu , Janet George , Daniel J. Linnen , Ashish Ghai
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Austin
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Austin
- The original application number of the division: US16870070 2020.05.08
- Main IPC: G06F30/398
- IPC: G06F30/398 ; G06F119/22 ; G06N3/04 ; G06N3/063 ; G06N3/08 ; H01L21/66

Abstract:
Techniques are presented for the application of neural networks to the fabrication of integrated circuits and electronic devices, where example are given for the fabrication of non-volatile memory circuits and the mounting of circuit components on the printed circuit board of a solid state drive (SSD). The techniques include the generation of high precision masks suitable for analyzing electron microscope images of feature of integrated circuits and of handling the training of the neural network when the available training data set is sparse through use of a generative adversary network (GAN).
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