Invention Publication
- Patent Title: Method and Treatment System for Uniform Processing of Semiconductor Devices
-
Application No.: US18152340Application Date: 2023-01-10
-
Publication No.: US20240234192A1Publication Date: 2024-07-11
- Inventor: Cheng-Shiuan Wong , Chao-Wei Chiu , Wei-Yu Chen , Chih-Chiang Tsao , Hao-Jan Pei , Hsiu-Jen Lin , Ching-Hua Hsieh
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/683
- IPC: H01L21/683

Abstract:
A method includes attaching a carrier to a semiconductor wafer using a release film; removing the carrier from the semiconductor wafer; and performing a treatment process to remove the release film from the semiconductor wafer, the treatment process comprising: flowing an etchant through a diffusion plate within a treatment chamber, the diffusion plate comprising concentric rings separated by dividers, the concentric rings comprising a first concentric ring of holes, a second concentric ring of holes, and a third concentric ring of holes, each of the concentric rings having a different hole density; and performing a cleaning process on the semiconductor wafer.
Information query
IPC分类: