- 专利标题: ARTIFACT MITIGATION IN CAPACITOR TRANSIMPEDANCE AMPLIFIER (CTIA)-BASED IMAGERS OR OTHER IMAGING DEVICES
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申请号: US18165663申请日: 2023-02-07
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公开(公告)号: US20240267655A1公开(公告)日: 2024-08-08
- 发明人: Bryan W. Kean
- 申请人: Raytheon Company
- 申请人地址: US MA Waltham
- 专利权人: Raytheon Company
- 当前专利权人: Raytheon Company
- 当前专利权人地址: US MA Waltham
- 主分类号: H04N25/778
- IPC分类号: H04N25/778 ; H03F3/08 ; H04N25/709
摘要:
An apparatus includes a photodetector configured to generate an electrical current based on received illumination. The apparatus also includes a capacitor transimpedance amplifier (CTIA) unit cell having (i) an amplifier configured to receive the electrical current and a first reference voltage and generate a pre-integration voltage, (ii) a feedback capacitor coupled in parallel across the amplifier, (iii) a reset switch coupled in parallel across the feedback capacitor, and (iv) a coupling capacitor coupled to an output of the amplifier and configured to receive the pre-integration voltage and generate an integration voltage. The apparatus further includes a comparator configured to compare the pre-integration voltage and a second reference voltage, where generation of the integration voltage is modifiable based on the comparison.
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