- 专利标题: SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
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申请号: US18302010申请日: 2023-04-18
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公开(公告)号: US20240355900A1公开(公告)日: 2024-10-24
- 发明人: Man-Nung Su
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L23/00 ; H01L23/12 ; H01L29/775
摘要:
A semiconductor device and a forming method thereof are provided. The semiconductor device includes a device layer including a front side and a back side opposite to each other, a bonding layer disposed on the back side of the device layer, and a carrier substrate underlying the bonding layer. The device layer includes source/drain (S/D) structures, semiconductor channel layers connecting the S/D structures, and a gate structure disposed between the S/D structures and around each of the semiconductor channel layers, where the back side is planar and includes the S/D structures and the gate structure.
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