A system can include a memory device and a processing device, operatively coupled with the memory device, to perform operations including writing data to an MU of the memory device and performing one or more scan operations on the MU to determine an aggregate value of a data state metric reflective of an amount of erroneous memory cells in the MU. The operations can include determining whether a value of the data state metric reflective of a specified set of erroneous memory cells in the MU satisfies a criterion and identifying a target programming level to which at least one erroneous memory cell was originally programmed. They can also include reprogramming the at least one erroneous memory cell to the target programming level.