Invention Application
- Patent Title: SEMICONDUCTOR DEVICE INCLUDING BACKSIDE SOURCE/DRAIN CONTACT STRUCTURE WITH CONTACT SPACER AND BACKSIDE GATE CONTACT STRUCTURE
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Application No.: US18380951Application Date: 2023-10-17
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Publication No.: US20240395900A1Publication Date: 2024-11-28
- Inventor: Seungchan YUN , Jason MARTINEAU , Kang-ill SEO
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/8234 ; H01L27/088 ; H01L29/06 ; H01L29/08 ; H01L29/423 ; H01L29/775 ; H01L29/786

Abstract:
A semiconductor device includes: a 1st source/drain region; a 2nd source/drain region; a channel structure connecting the 1st source/drain region to the 2nd source/drain region; a gate structure configured to control the channel structure; a backside source/drain contact structure connected to a bottom surface of the 1st source/drain region; a backside isolation structure at a lower portion of the semiconductor device; and a 1st contact spacer on the backside source/drain contact structure, wherein the 1st contact spacer is configured to isolate the backside source/drain contact structure from another circuit element in the backside isolation structure.
Information query
IPC分类: