Invention Application
- Patent Title: Methods for Depositing Film Layers
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Application No.: US18371708Application Date: 2023-09-22
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Publication No.: US20250101575A1Publication Date: 2025-03-27
- Inventor: Yaoying ZHONG , Siew Kit HOI , Haomin XU , Li Ying CHOO , Xiao TAN , Jay Min SOH
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: C23C16/04
- IPC: C23C16/04 ; C23C16/12

Abstract:
A method for depositing a film layer on a substrate incorporates ion flux control to alter sputtering atom trajectories. A method may include flowing argon gas around a periphery of the substrate with a surface of the substrate having a plurality of structures with sidewalls and an edge region containing edge structures near the periphery of the substrate, forming a plasma to ionize the argon gas to form Ar+ ion flux to induce sputtering of aluminum to generate aluminum atoms for deposition on the substrate, generating an AC bias on the substrate to increase the Ar+ ion flux density at the edge region of the substrate to alter aluminum atom trajectories striking the edge region, and heating the substrate to increase mobility of the aluminum atoms deposited on the edge structures.
Information query
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