Invention Application
- Patent Title: SEMICONDUCTOR DEVICE AND METHOD
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Application No.: US19019957Application Date: 2025-01-14
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Publication No.: US20250159969A1Publication Date: 2025-05-15
- Inventor: Kai-Qiang Wen , Shih-Fen Huang , Shih-Chun Fu , Chi-Yuan Shih , Feng Yuan
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H10D84/03
- IPC: H10D84/03 ; H10D1/47 ; H10D30/62 ; H10D84/01 ; H10D84/80

Abstract:
A device includes a fin on a substrate; a first transistor, including: a drain region and a first source region in the fin; and a first gate structure on the fin between the first source region and the drain region; a second transistor, including: the drain region and a second source region in the fin; and a second gate structure on the fin between the second source region and the drain region; a first resistor, including: the first source region and a first resistor region in the fin; and a third gate structure on the fin between the first source region and the first resistor region; and a second resistor, including: the second source region and a second resistor region in the fin; and a fourth gate structure on the fin between the second source region and the second resistor region.
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