Invention Grant
- Patent Title: X-ray fluorescence analysis of multi-component systems
- Patent Title (中): 多组分系统的X射线荧光分析
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Application No.: US43279354Application Date: 1954-05-27
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Publication No.: US3102952APublication Date: 1963-09-03
- Inventor: HENDEE CHARLES F , SAMUEL FINE
- Applicant: PHILIPS CORP
- Assignee: Philips Corp
- Current Assignee: Philips Corp
- Priority: US43279354 1954-05-27
- Main IPC: G01N23/223
- IPC: G01N23/223
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