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公开(公告)号:US3102952A
公开(公告)日:1963-09-03
申请号:US43279354
申请日:1954-05-27
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE
IPC: G01N23/223
CPC classification number: G01N23/223 , G01N2223/076
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公开(公告)号:US2882418A
公开(公告)日:1959-04-14
申请号:US44705454
申请日:1954-08-02
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE
IPC: G01N23/223 , H01J47/06
CPC classification number: G01N23/223 , G01N2223/076 , H01J47/06
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公开(公告)号:US2881325A
公开(公告)日:1959-04-07
申请号:US43707454
申请日:1954-06-16
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , BROWN WALTER B
IPC: G01T1/36
CPC classification number: G01T1/36
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公开(公告)号:US2837678A
公开(公告)日:1958-06-03
申请号:US43783154
申请日:1954-06-18
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE
IPC: H01J47/06
CPC classification number: H01J47/06
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5.Apparatus for determining the composition and condition of a specimen of material 失效
Title translation: 用于确定材料样本的组成和状况的装置公开(公告)号:US2982814A
公开(公告)日:1961-05-02
申请号:US71539258
申请日:1958-02-14
Applicant: PHILIPS CORP
Inventor: SAMUEL FINE , HENDEE CHARLES F
IPC: G01N23/225
CPC classification number: G01N23/225
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公开(公告)号:US2924715A
公开(公告)日:1960-02-09
申请号:US58889856
申请日:1956-06-01
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE
IPC: G01N23/20 , G01N23/207 , G01N23/223 , H01J47/06
CPC classification number: G01N23/223 , G01N23/20025 , G01N23/207 , G01N2223/076 , H01J47/06
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公开(公告)号:US2860254A
公开(公告)日:1958-11-11
申请号:US50558755
申请日:1955-05-03
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F
IPC: H01J47/08
CPC classification number: H01J47/08
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公开(公告)号:US2881327A
公开(公告)日:1959-04-07
申请号:US54037555
申请日:1955-10-14
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE
IPC: G01N23/207
CPC classification number: G01N23/207
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公开(公告)号:US2837677A
公开(公告)日:1958-06-03
申请号:US40452454
申请日:1954-01-18
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE , JAN BLEEKSMA
IPC: H01J47/06
CPC classification number: H01J47/06
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10.X-ray analysis system and radiation detector for use in such system 失效
Title translation: 用于这种系统的X射线分析系统和辐射探测器公开(公告)号:US2837656A
公开(公告)日:1958-06-03
申请号:US56241256
申请日:1956-01-31
Applicant: PHILIPS CORP
Inventor: HENDEE CHARLES F , SAMUEL FINE
IPC: H01J47/06
CPC classification number: H01J47/06
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