发明授权
US3614609A Go/no-go times circuit using a tunnel diode to sample a test waveform 失效
使用隧道二极管测试波形的GO / NO-GO TIMES电路

  • 专利标题: Go/no-go times circuit using a tunnel diode to sample a test waveform
  • 专利标题(中): 使用隧道二极管测试波形的GO / NO-GO TIMES电路
  • 申请号: US3614609D
    申请日: 1970-04-10
  • 公开(公告)号: US3614609A
    公开(公告)日: 1971-10-19
  • 发明人: GRUBEL STANLEY JSTIRLING HUGH R
  • 申请人: IBM
  • 专利权人: Ibm
  • 当前专利权人: Ibm
  • 优先权: US2734170 1970-04-10
  • 主分类号: G01R19/165
  • IPC分类号: G01R19/165 G01R29/02 G01R31/26 G01R19/00 H03K17/58
Go/no-go times circuit using a tunnel diode to sample a test waveform
摘要:
An improvement to a system for measuring (a) the voltage level of a waveform at a specific time with respect to a reference point in time, (e.g., clock or sync pulse) and (b) the time required with respect to a reference time for a waveform to reach a specific voltage level. In the first case, the voltage at a given sample time is measured, while in the second case, the time to a given voltage is measured. The system incorporates a go/nogo decision circuit which determines if the characteristics of a circuit under test satisfy certain reference criteria. The go/nogo circuit comprises a discriminator which examines a test signal for both amplitude and time. The discriminator compares the level of the input test signal with a reference signal at the time of strobe occurrence. The condition of the discriminator is monitored by a detector circuit which further passes this condition on to a voting logic which makes a go/no-go decision based on a plurality of samples.
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