发明授权
- 专利标题: Integrating component measuring device
- 专利标题(中): 集成元件测量装置
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申请号: US538496申请日: 1975-01-03
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公开(公告)号: US3947760A公开(公告)日: 1976-03-30
- 发明人: Hitoshi Noguchi , Kohichi Maeda , Takeshi Kyo
- 申请人: Hitoshi Noguchi , Kohichi Maeda , Takeshi Kyo
- 申请人地址: CA Palo Alto
- 专利权人: Hewlett-Packard Company
- 当前专利权人: Hewlett-Packard Company
- 当前专利权人地址: CA Palo Alto
- 主分类号: G01R27/02
- IPC分类号: G01R27/02 ; H03M1/00 ; G01R27/00
摘要:
A method and means for measuring the electric properties of capacitor, inductor and resistor elements is described. The element to be measured and a reference element are connected in series, and standard A.C. voltage is applied to one end of the series circuit whereas a variable voltage is applied to the other end of said circuit. The variable voltage is controlled in order to zero the voltage or the current at the common junction of both the element to be measured and the reference element. Said standard voltage and said variable voltage are rectified, and the generated D.C. signals are used for charging integrator capacitors. These capacitors are then discharged and the ratio of charging and discharging time is a measure of the resistance, capacitance and inductance, respectively, of the unknown element. Dielectric and magnetic dissipation factors may be measured in a similar manner.
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