发明授权
- 专利标题: High frequency sputtering produces thin film amorphous silicon photoconductor
- 专利标题(中): 高频溅射产生薄膜非晶硅光电导体
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申请号: US90721申请日: 1979-11-02
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公开(公告)号: US4297392A公开(公告)日: 1981-10-27
- 发明人: Akio Higashi , Kazuhiro Kawaziri , Yosuke Nakajima
- 申请人: Akio Higashi , Kazuhiro Kawaziri , Yosuke Nakajima
- 申请人地址: JPX Minami-ashigara
- 专利权人: Fuji Photo Film Co., Ltd.
- 当前专利权人: Fuji Photo Film Co., Ltd.
- 当前专利权人地址: JPX Minami-ashigara
- 优先权: JPX53-135179 19781102
- 主分类号: G03G5/08
- IPC分类号: G03G5/08 ; G03G5/082 ; H01L31/0248 ; H01L31/09 ; H01L31/20
摘要:
In the course of producing a thin film of amorphous silicon by high frequency sputtering elemental silicon under an atmosphere containing at least hydrogen gas, the temperature of the base plate onto which the amorphous silicon is deposited is maintained at a temperature of about 50.degree. C. to 150.degree. C. The thus obtained silicon film possesses not only photoconductivity sufficient for use as a photoconductor but also a large difference between photoconductivity and dard conductivity. In addition, a photoconductor of an amorphous silicon thin film can be produced at low cost without environmental pollution problems.
公开/授权文献
- US6002162A Overall VPP well form 公开/授权日:1999-12-14
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