发明授权
US4403858A Defect inspection system 失效
缺陷检查系统

Defect inspection system
摘要:
A defect inspection system in which a reflector body is arranged at such an angle relative to an object to be inspected that in spite of any parallel movements of the image does not overlap the inspected object. The inspected object and the image thereof are both simultaneously picked up by the same television camera. Then, the video signal from the television camera is fed to a processor which then inspects whether or not the object to be inspected contains defects or flaws.
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