发明授权
- 专利标题: Light scattering measuring apparatus
- 专利标题(中): 光散射测量装置
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申请号: US804108申请日: 1985-12-03
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公开(公告)号: US4682897A公开(公告)日: 1987-07-28
- 发明人: Kenji Saito , Ken Eguchi , Haruki Kawada , Yoshinori Tomida , Yukuo Nishimura , Takashi Nakagiri
- 申请人: Kenji Saito , Ken Eguchi , Haruki Kawada , Yoshinori Tomida , Yukuo Nishimura , Takashi Nakagiri
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX59-259072 19841210; JPX59-259073 19841210; JPX59-259074 19841210; JPX59-259075 19841210; JPX59-259076 19841210
- 主分类号: G01N21/17
- IPC分类号: G01N21/17 ; G01N21/47 ; G01N21/41 ; G01N25/72
摘要:
A light scattering measuring apparatus utilizes light scattering to analyze physical properties of the surface and interior of an object, and particularly converts the scattered light therefrom into molecular vibrational energy or heat energy and measures the same. The light scattering measuring apparatus is provided with light applying means for applying an intermittent light to an object to be examined, a medium for absorbing scattered light intermittently emitted from the surface of the object by the applied light in accordance with the physical properties of the object to be examined and converting the scatterd light into molecular vibrational energy or heat energy, a detecting device for detecting the information regarding the energy produced by the medium, and a measuring device for measuring the molecular vibrational energy or the heat energy on the basis of a signal produced by the detecting device.
公开/授权文献
- US5858812A Method for fabricating interline-transfer CCD image sensor 公开/授权日:1999-01-12
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