发明授权
- 专利标题: Scanning particle microscope
- 专利标题(中): 扫描粒子显微镜
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申请号: US751020申请日: 1985-07-02
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公开(公告)号: US4713543A公开(公告)日: 1987-12-15
- 发明人: Hans-Peter Feuerbaum , Juergen Frosien , Rainer Spehr
- 申请人: Hans-Peter Feuerbaum , Juergen Frosien , Rainer Spehr
- 申请人地址: DEX Berlin and Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DEX Berlin and Munich
- 优先权: DEX3429804 19840813
- 主分类号: H01J37/141
- IPC分类号: H01J37/141 ; H01J37/04 ; H01J37/10 ; H01J37/28
摘要:
There is disclosed a scanning particle microscope in which the adverse influence of the Boersch effect is reduced. This is achieved by providing an elastrostatic retardation element in the particle optics unit to decelerate the particle from a first energy, at which the particles are generated, to a second energy which is less than half of the first energy.
公开/授权文献
- US4101225A Applicator, especially for pigmented liquids 公开/授权日:1978-07-18
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