发明授权
US4713543A Scanning particle microscope 失效
扫描粒子显微镜

Scanning particle microscope
摘要:
There is disclosed a scanning particle microscope in which the adverse influence of the Boersch effect is reduced. This is achieved by providing an elastrostatic retardation element in the particle optics unit to decelerate the particle from a first energy, at which the particles are generated, to a second energy which is less than half of the first energy.
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