发明授权
- 专利标题: Uneven-surface data detection apparatus
- 专利标题(中): 不均匀数据检测装置
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申请号: US833276申请日: 1986-02-27
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公开(公告)号: US4728186A公开(公告)日: 1988-03-01
- 发明人: Shin Eguchi , Seigo Igaki , Hironori Yahagi , Fumio Yamagishi , Hiroyuki Ikeda , Takefumi Inagaki
- 申请人: Shin Eguchi , Seigo Igaki , Hironori Yahagi , Fumio Yamagishi , Hiroyuki Ikeda , Takefumi Inagaki
- 申请人地址: JPX Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX60-041437 19850303; JPX60-059801 19850325; JPX60-181066 19850820; JPX60-212571 19850927; JPX60-212568 19850927; JPX60-212565 19850927; JPX60-282319 19851216; JPX61-004852 19860113; JPX61-004853 19860113; JPX61-006750 19860116
- 主分类号: G02B6/26
- IPC分类号: G02B6/26 ; G02B6/35 ; G06K9/00 ; G07C9/00 ; G06K9/74
摘要:
An uneven-surface data detection apparatus, includes a transparent plate having an uneven-surface contact portion against which an uneven surface to be detected is pressed. A light source illuminates the uneven-surface contact portion through the transparent plate. An uneven-surface image drawing out optical element draws out the light reflected on the uneven-surface contact portion of the transparent plate. A detector detects the light drawn out from the transparent plate by the optical element.Light reflected by a projection-facing portion of the uneven surface contact portion to be introduced into the detector diverges from a propagation direction of light reflected by a recess-facing portion of the uneven surface contact portion. The optical element is arranged to guide the light reflected by the projection-facing portion into the detector.
公开/授权文献
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