发明授权
- 专利标题: Slit scanning and deteching system
- 专利标题(中): 狭缝扫描和检测系统
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申请号: US882093申请日: 1986-07-03
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公开(公告)号: US4763345A公开(公告)日: 1988-08-09
- 发明人: Zoran L. Barbaric , Michael Deckard , Robert S. Nelson
- 申请人: Zoran L. Barbaric , Michael Deckard , Robert S. Nelson
- 申请人地址: CA Berkeley
- 专利权人: The Regents of the University of California
- 当前专利权人: The Regents of the University of California
- 当前专利权人地址: CA Berkeley
- 主分类号: A61B6/06
- IPC分类号: A61B6/06 ; G21K5/10
摘要:
A scanning system for use in radiology incorporates two disks bearing identically patterned, radial arrays of apertures and corresponding X-ray detection materials, respectively. The disks are axially aligned and synchronously rotated on opposite sides of the radiological target. X-rays emitted adjacent to the first disk are strobed by the apertures and detected by photodiode arrays on the second disk after passing through said target. The detection array is scanned to produce the X-ray information for digital processing and imaging. The foregoing apparatus may be portable and mounted for retrofitting relative to existing X-ray installations.
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