发明授权
US4903238A Semiconductor memory device with improved immunity to supply voltage
fluctuations
失效
半导体存储器件具有改善的抗电压供应电压波动
- 专利标题: Semiconductor memory device with improved immunity to supply voltage fluctuations
- 专利标题(中): 半导体存储器件具有改善的抗电压供应电压波动
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申请号: US201787申请日: 1988-06-02
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公开(公告)号: US4903238A公开(公告)日: 1990-02-20
- 发明人: Hideshi Miyatake , Masaki Kumanoya , Katsumi Dosaka
- 申请人: Hideshi Miyatake , Masaki Kumanoya , Katsumi Dosaka
- 申请人地址: JPX Tokyo
- 专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX62-140197 19870604
- 主分类号: G11C11/41
- IPC分类号: G11C11/41 ; G11C5/14 ; G11C11/409 ; G11C11/419
摘要:
A semiconductor memory device such as a static RAM (Random Access Memory) device comprises a ground connection circuit of n channel field effect transistors connected between two I/O lines and the ground. The precharge circuit for precharging and the ground connection circuit both operate in response to the signal which is in synchronization with an externally applied external chip select signal. Therefore, the access delay derived from the fluctuation of the supply voltage generated before the change of the external chip select signal can be prevented.
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