发明授权
US4904612A Method for manufacturing a planar, self-aligned emitter-base complex
失效
制造平面,自对准发射体 - 基复合物的方法
- 专利标题: Method for manufacturing a planar, self-aligned emitter-base complex
- 专利标题(中): 制造平面,自对准发射体 - 基复合物的方法
-
申请号: US374617申请日: 1989-06-30
-
公开(公告)号: US4904612A公开(公告)日: 1990-02-27
- 发明人: Hans-Peter Zwicknagl , Josef Willer , Helmut Tews
- 申请人: Hans-Peter Zwicknagl , Josef Willer , Helmut Tews
- 申请人地址: DEX Berlin and Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DEX Berlin and Munich
- 优先权: DEX3735999 19871023
- 主分类号: H01L29/73
- IPC分类号: H01L29/73 ; H01L21/28 ; H01L21/331 ; H01L29/737
摘要:
A method for the manufacture of a planar, self-aligned emitter-base complex, whereby a semiconductor layer structure standard for hetero-bipolar transistors is first grown on a substrate, the base regions are subsequently etching through a mask technique and are provided with the base metallization and with a first dielectric layer and insulation implantations and spacers for electrical insulation of the base are manufactured, and, following thereupon, the emitter region is provided with the emitter metallization and with a third dielectric layer.
公开/授权文献
- US5600040A Separation of tetrafluoroethane isomers 公开/授权日:1997-02-04
信息查询
IPC分类: