发明授权
US4935790A EEPROM memory cell with a single level of polysilicon programmable and erasable bit by bit 失效
EEPROM存储单元具有单级多晶硅可编程和可擦除位

EEPROM memory cell with a single level of polysilicon programmable and
erasable bit by bit
摘要:
The cell is formed of a selection transistor, a detection transistor and a tunnel condenser. The detection Transistor has its own control gate formed with an n.sup.+ diffusion which is closed and isolated from those of the other cells of the same memory.
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