- 专利标题: Plasma processing method and apparatus
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申请号: US403821申请日: 1989-09-07
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公开(公告)号: US5041201A公开(公告)日: 1991-08-20
- 发明人: Shunpei Yamazaki , Mitsunori Tsuchiya , Shigenori Hayashi , Naoki Hirose , Noriya Ishida , Mari Sasaki , Atsushi Kawano
- 申请人: Shunpei Yamazaki , Mitsunori Tsuchiya , Shigenori Hayashi , Naoki Hirose , Noriya Ishida , Mari Sasaki , Atsushi Kawano
- 申请人地址: JPX Kanagawa
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JPX Kanagawa
- 优先权: JPX63-233166 19880916; JPX62-233167 19880916; JPX63-233168 19880916
- 主分类号: C23C16/26
- IPC分类号: C23C16/26 ; C23C16/517
摘要:
Plasma CVD method and apparatus are described. The apparatus comprises a vacuum chamber in which two pairs of electrodes are provided. A high frequency voltage is applied to one of the pairs in order to produce a plasma from a reactive gas in the chamber. A substrate to be coated is located between the other of the pairs. A relatively low frequency voltage is applied to the other pair of electrodes. By virtue of the low frequency voltage, the substrate is exposed to the bombardment of ions of the plasma during deposition. The bombardment functions to remove relatively soft portions of the depositing material.
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