发明授权
- 专利标题: Apparatus for inspecting packaged electronic device
- 专利标题(中): 用于检查包装电子设备的装置
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申请号: US143084申请日: 1988-01-12
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公开(公告)号: US5093797A公开(公告)日: 1992-03-03
- 发明人: Teruhisa Yotsuya , Shigeki Kobayashi , Yasuaki Tanimura
- 申请人: Teruhisa Yotsuya , Shigeki Kobayashi , Yasuaki Tanimura
- 申请人地址: JPX Kyoto
- 专利权人: Omron Tateisi Electronics Co.
- 当前专利权人: Omron Tateisi Electronics Co.
- 当前专利权人地址: JPX Kyoto
- 优先权: JPX62-5273 19870113; JPX62-5274 19870113; JPX62-5275 19870113; JPX62-5276 19870113
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G01R31/309
摘要:
A printed circuit board inspecting apparatus, in which image data of a packaged circuit board under inspection obtained by picking up the image of the circuit board are processed through predetermined processing procedure for examining packaged states of parts mounted on the packaged cicuit board. The apparatus comprises an imaging unit for picking up the image of a packaged circuit board, a decision unit for deciding the state of the parts mounted on the packaged circuit board, and a visualizing unit for displaying visibly the result of the decision and position of the relevant part in correspondence with each other. The apparatus can further include a land extracting unit for extracting lands from the image obtained through the imaging of the packaged circuit board under inspection, an alarm condition setting unit for setting the condition for generating an alarm, and an alarm generating unit for generating the alarm when the alarm condition is met by the result of decision made by the decision unit.
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