发明授权
US5124945A Method and apparatus for verifying the state of a plurality of
electrically programmable memory cells
失效
用于验证电子可编程存储器单元的多样性状态的方法和装置
- 专利标题: Method and apparatus for verifying the state of a plurality of electrically programmable memory cells
- 专利标题(中): 用于验证电子可编程存储器单元的多样性状态的方法和装置
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申请号: US737830申请日: 1991-07-29
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公开(公告)号: US5124945A公开(公告)日: 1992-06-23
- 发明人: John F. Schreck
- 申请人: John F. Schreck
- 申请人地址: TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: TX Dallas
- 主分类号: G11C29/00
- IPC分类号: G11C29/00 ; G11C16/02 ; G11C16/04 ; G11C16/10 ; G11C16/34 ; G11C17/00 ; G11C29/12 ; G11C29/50
摘要:
Apparatus for verifying the state of a plurality of electrically programmable memory cells (30-70) includes first and second memory cells (36, 38) each having current paths with first and second ends. A memory cell state sense node (BL2) is coupled to the first ends. A first array source node (82) is coupled to a second end of the current path of the first cell (36). A second array source node (84) is coupled to a second end of the current path of the second cell (38). First circuitry (160-198) is provided for sensing a program verify state (DATA, WE). Decoded ground circuitry (150, 144, 142) couples a selected one of the first and second array source nodes (140) to a low voltage source (Vss) in response to the first circuitry sensing a program verify state (DATA, WE). Second circuitry (130, 138, 134) selectively isolates at least a nonselected one of the first and second array source nodes (82, 84) from the voltage bias source in response to the first circuitry (160-198 ) sensing a program verify state (DATA, WE).
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