发明授权
US5175689A Apparatus for processing tool path to obtain workpiece examination data
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用于加工刀具路径的装置,以获得工件检验数据
- 专利标题: Apparatus for processing tool path to obtain workpiece examination data
- 专利标题(中): 用于加工刀具路径的装置,以获得工件检验数据
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申请号: US564764申请日: 1990-08-03
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公开(公告)号: US5175689A公开(公告)日: 1992-12-29
- 发明人: Hirokazu Matsushita , Yukio Hayakawa , Yoshiteru Iwata
- 申请人: Hirokazu Matsushita , Yukio Hayakawa , Yoshiteru Iwata
- 申请人地址: JPX Aichi
- 专利权人: Kabushiki Kaisha Okuma Tekkosho
- 当前专利权人: Kabushiki Kaisha Okuma Tekkosho
- 当前专利权人地址: JPX Aichi
- 优先权: JPX1-210385 19890815
- 主分类号: B23Q15/00
- IPC分类号: B23Q15/00 ; G05B19/4063 ; G05B19/4097 ; G05B19/42
摘要:
A data processing apparatus generates data denoting a predetermined point on a virtual surface shape formed denoting the basis of digitized data on a tool path for an inverted shape work piece, to thereby facilitates examination of the size of the inverted shape work piece. That is, digitized data obtained by scanning a model shape is input and edited to prepare digitized data representing a tool path for machining a work piece. The digitized data representing the tool path is converted to prepare a numerical control working program. Work piece examination data are also prepared based on denoting an arbitrary measurement point of a scanning probe, data denoting the measuring direction at the measuring point and the digitized data representing the tool path for machining the work piece.
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