发明授权
- 专利标题: Method for controlling the thickness of a layer of material in a seam
- 专利标题(中): 用于控制接缝中材料层厚度的方法
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申请号: US757560申请日: 1991-09-11
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公开(公告)号: US5188426A公开(公告)日: 1993-02-23
- 发明人: Larry G. Stolarczyk , Gerald L. Stolarczyk , David L. Baldridge
- 申请人: Larry G. Stolarczyk , Gerald L. Stolarczyk , David L. Baldridge
- 申请人地址: NM Raton
- 专利权人: Stolar, Inc.
- 当前专利权人: Stolar, Inc.
- 当前专利权人地址: NM Raton
- 主分类号: G01B15/02
- IPC分类号: G01B15/02 ; G01V3/10
摘要:
A method for determining the thickness of a layer of material, such as soil, wood, ice or coal, that utilizes a microstrip antenna as a thickness measuring sensor. The sensor is positioned over the layer and a value for a parameter of the antenna such as conductance or resonant frequency is measured. The value is compared to a calibration table of values and the thickness of the layer is determined by interpolation. Alternatively, the value is compared to a control value to initiate a decision process. The decision could be that a layer of ice is building up on a wing of an aircraft or that an explosive device is buried under a layer of soil.
公开/授权文献
- US5832072A Communication network with hidden calling number capability 公开/授权日:1998-11-03
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